• Hotenda
• 2025-09-04

Kioxia Iwate to Evaluate Nagoya University’s GaN-Based e-Beam Inspection Technology for Advanced Semiconductor Manufacturing

It was recently announced that GaN (Gallium Nitride)-based e-Beam inspection and metrology technology, jointly developed by Nagoya University startup Photo electron Soul Inc.

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• Hotenda
• 2025-09-15

Intel 1103: The DRAM Chip That Dethroned Magnetic Core Memory

In 1970, Intel’s 1103 became the first commercially successful DRAM chip, and the first time a semiconductor memory beat magnetic core at its own game: price, density, and logic-level compatibility.

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