Welcome to Hotenda.com Online Store!

logo
userjoin
Home

PMV28UN,215

PMV28UN,215

PMV28UN,215

NXP USA Inc.

MOSFET N-CH 20V 3.3A SOT-23

SOT-23

PMV28UN,215 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Mounting Type Surface Mount
Package / Case TO-236-3, SC-59, SOT-23-3
Operating Temperature-55°C~150°C TJ
PackagingTape & Reel (TR)
Published 2014
Part StatusObsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Technology MOSFET (Metal Oxide)
Pin Count3
Power Dissipation-Max 380mW Ta
FET Type N-Channel
Rds On (Max) @ Id, Vgs 32m Ω @ 3.3A, 4.5V
Vgs(th) (Max) @ Id 1V @ 270μA
Input Capacitance (Ciss) (Max) @ Vds 470pF @ 10V
Current - Continuous Drain (Id) @ 25°C 3.3A Ta
Gate Charge (Qg) (Max) @ Vgs 9nC @ 4.5V
Drain to Source Voltage (Vdss) 20V
Drive Voltage (Max Rds On,Min Rds On) 1.8V 4.5V
Vgs (Max) ±8V
Source Url Status Check Date 2013-06-14 00:00:00
RoHS StatusROHS3 Compliant
In-Stock:80182 items

Pricing & Ordering

QuantityUnit PriceExt. Price
1$1.332462$1.332462
10$1.257040$12.5704
100$1.185887$118.5887
500$1.118761$559.3805
1000$1.055435$1055.435

About PMV28UN,215

The PMV28UN,215 from NXP USA Inc. is a high-performance microcontroller designed for a wide range of embedded applications. This component features MOSFET N-CH 20V 3.3A SOT-23.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the PMV28UN,215, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News