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SI5320-H-ZL3

SI5320-H-ZL3

SI5320-H-ZL3

Silicon Labs

3.3V Clock Generators 63 Pins 63-LBGA 63 Terminals Surface Mount Tray

SOT-23

SI5320-H-ZL3 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Factory Lead Time 12 Weeks
Mounting Type Surface Mount
Package / Case 63-LBGA
Surface MountYES
PackagingTray
Part StatusObsolete
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Number of Terminations 63
HTS Code8542.39.00.01
Terminal Position BOTTOM
Terminal FormBALL
Number of Functions 1
Supply Voltage 3.3V
Terminal Pitch1mm
Pin Count63
JESD-30 Code S-PBGA-B63
Qualification StatusNot Qualified
Operating Temperature (Max) 85°C
Operating Temperature (Min) -40°C
Temperature GradeINDUSTRIAL
Telecom IC Type ATM/SONET/SDH SUPPORT CIRCUIT
Height Seated (Max) 1.58mm
Length 9mm
Width 9mm
RoHS StatusRoHS Compliant
In-Stock:2109 items

SI5320-H-ZL3 Product Details

SI5320-H-ZL3 Overview


It is packaged using the Tray method since it is a clock IC. 63-LBGA contains this Clock PLL. 63 terminations can be found in frequency generators. A voltage of 3.3V should be applied to this electronic frequency generator. Thanks to the Surface Mount, this electric component can easily be installed on a panel. In addition, the PLL may cause ha85°Cards once the temperature is set higher than 85°C. An ambient temperature below -40°C may cause this frequency generator to malfunction. Microprocessors are specifically designed to use this clock-generating IC, which has a 63-bit output. The telecom IC clock time generator adopts is ATM/SONET/SDH SUPPORT CIRCUIT.

SI5320-H-ZL3 Features


Available in the 63-LBGA
Supply voltage of 3.3V

SI5320-H-ZL3 Applications


There are a lot of Silicon Labs SI5320-H-ZL3 Clock Generators applications.

  • Clock generation systems
  • Test equipment
  • Digital HDTV systems
  • Instrument
  • Picocells, femtocells and small cells
  • Small signal recovery
  • Various decoding circuits
  • Integrated phase noise in aerospace systems
  • Microwave point-to-point systems
  • Automatic test equipment

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