LMK04100SQX/NOPB Overview
Clock generator is packaged in the way of Tape & Reel (TR). 48-WFQFN Exposed Pad contains this Clock PLL. In the reflowing process, this clock generator ic is able to maintain a maximum temperature of 260. It contains a total of 48 terminations within RF synthesizer. Basically, this time clock generator needs a voltage of 3.3V. The input of this clock generator is designed to be LVCMOS, LVDS, LVPECL. To access the full performance of the electronic component, 1 circuits are implemented. It provides a maximum frequency of 1.08GHz. A Surface Mount-shaped electrical component makes it convenient to mount on a panel. Clock generators should operate with the voltage supply of 3.15V~3.45V. Using the test statistics, we estimate that the ambient temperature should be -40°C~85°C. In this case, we are dealing with a frequency synthesizer that can be used with LVCMOS, 2VPECL, LVPECL logic levels. It is possible to find its related electronic parts by searching for the base part number LMK04100. There are 48 pins on the frequency generator that are available for use. The maximum supply voltage that analog clock generator can handle is 3.3V. An electronic part belonging to the PLLatinum? series is being used here. The output frequency is magnified as high as possible with 7 signal outputs. An ATM/SONET/SDH SUPPORT CIRCUIT-telecom clock generator with hitless switching, holdover, and jitter control. This clock generator has 2 inputs. Depending on the application, the frequency synthesizers can be used in SONET; SDH-direction.
LMK04100SQX/NOPB Features
Available in the 48-WFQFN Exposed Pad
Supply voltage of 3.3V
Operating supply voltage of 3.3V
LMK04100SQX/NOPB Applications
There are a lot of Texas Instruments LMK04100SQX/NOPB Clock Generators applications.
- Laptops
- Line cards used in telephone exchange
- PCI express cards
- Ultrasound diagnosis
- High-speed communication applications
- Satellite receivers
- Aerospace and defense
- Small signal recovery
- Signal generator
- Precision auxiliary angle deflection measurement