Welcome to Hotenda.com Online Store!

logo
userjoin
Home

92UT78472

92UT78472

92UT78472

TECONNECTIVITY

92UT78472 datasheet pdf and Buzzer Elements, Piezo Benders product details from TECONNECTIVITY stock available on our website

SOT-23

92UT78472 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Factory Lead Time -
Lifecycle Status 30 Weeks
Mount Flanges
Mounting Type Flanges
Package / Case SOT-23
Number of Pins 4
Operating Temperature -55°C ~ 150°C
Packaging Bulk
Pbfree Code yes
Part Status Not For New Designs
Moisture Sensitivity Level (MSL) 1
Number of Terminations 3
ECCN Code -
Temperature Coefficient -
Subcategory Other Sensors/Transducers
Voltage - Supply 20V ~ 50V
Base Part Number Udiu Pnvda
Output Voltage 36 V
Output Type N-Channel
Interface I2C, SPI
Termination Type -
Operating Supply Current 1.5 mA
Nominal Supply Current 80 μA
Output Current 50 mA
Max Supply Current -
Slew Rate 0.6V/μs
Architecture VOLTAGE-FEEDBACK
Amplifier Type -
In-Stock:3690 items

About 92UT78472

The 92UT78472 from TECONNECTIVITY is a high-performance microcontroller designed for a wide range of embedded applications. This component features 92UT78472 datasheet pdf and Buzzer Elements, Piezo Benders product details from TECONNECTIVITY stock available on our website.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the 92UT78472, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News