Welcome to Hotenda.com Online Store!

logo
userjoin
Home

2215UT15562

2215UT15562

2215UT15562

TEAPPLICATIONTOOLING

2215UT15562 datasheet pdf and Boxes product details from TEAPPLICATIONTOOLING stock available on our website

SOT-23

2215UT15562 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Factory Lead Time -
Lifecycle Status 8 Weeks
Mount Chassis
Mounting Type Surface Mount
Package / Case SOIC
Number of Pins 3
Operating Temperature -40°C ~ 110°C
Packaging Bulk
Pbfree Code yes
Part Status Not For New Designs
Moisture Sensitivity Level (MSL) Not Applicable
Number of Terminations 6
ECCN Code EAR99
Temperature Coefficient -
Subcategory -
Voltage - Supply 4V ~ 30V
Base Part Number Dskk Xgq
Output Voltage 36 V
Output Type P-Channel
Interface I2C, SPI
Termination Type SOLDER
Operating Supply Current 800 μA
Nominal Supply Current 1.5 mA
Output Current 80 mA
Max Supply Current 80 μA
Slew Rate 0.6V/μs
Architecture -
Amplifier Type OPERATIONAL AMPLIFIER
In-Stock:3384 items

About 2215UT15562

The 2215UT15562 from TEAPPLICATIONTOOLING is a high-performance microcontroller designed for a wide range of embedded applications. This component features 2215UT15562 datasheet pdf and Boxes product details from TEAPPLICATIONTOOLING stock available on our website.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the 2215UT15562, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News