Welcome to Hotenda.com Online Store!

logo
userjoin
Home

PC3H712NIP

PC3H712NIP

PC3H712NIP

Sharp Microelectronics

PC3H712NIP datasheet pdf and Optoisolators - Transistor, Photovoltaic Output product details from Sharp Microelectronics stock available on our website

SOT-23

PC3H712NIP Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Mount Surface Mount
Package / Case SMD/SMT
Number of Pins 4
PackagingCut Tape (CT)
Published 2003
Part StatusObsolete
Moisture Sensitivity Level (MSL) Not Applicable
Output Voltage 80V
Number of Channels 1
Number of Circuits 1
Output Current per Channel 50mA
Rise Time4μs
Collector Emitter Voltage (VCEO) 200mV
RoHS StatusNon-RoHS Compliant
Lead Free Contains Lead
In-Stock:2680 items

Pricing & Ordering

QuantityUnit PriceExt. Price
1$0.054944$0.054944
500$0.040400$20.2
1000$0.033667$33.667
2000$0.030887$61.774
5000$0.028866$144.33
10000$0.026852$268.52
15000$0.025969$389.535
50000$0.025535$1276.75

About PC3H712NIP

The PC3H712NIP from Sharp Microelectronics is a high-performance microcontroller designed for a wide range of embedded applications. This component features PC3H712NIP datasheet pdf and Optoisolators - Transistor, Photovoltaic Output product details from Sharp Microelectronics stock available on our website.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the PC3H712NIP, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News