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TOLCUT12032LQLCK

TOLCUT12032LQLCK

TOLCUT12032LQLCK

SAMTECINC

TOLCUT12032LQLCK datasheet pdf and Evaluation, Development Board Enclosures product details from SAMTECINC stock available on our website

SOT-23

TOLCUT12032LQLCK Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Factory Lead Time NRND (Last Updated: 1 week ago)
Lifecycle Status 30 Weeks
Mount Cable, Free Hanging
Mounting Type Press Fit, Through Hole
Package / Case 8-SOIC (0.154, 3.90mm Width)
Number of Pins 9
Operating Temperature -55°C ~ 150°C
Packaging Bulk
Pbfree Code -
Part Status -
Moisture Sensitivity Level (MSL) -
Number of Terminations 4
ECCN Code EAR99
Temperature Coefficient -
Subcategory Other Sensors/Transducers
Voltage - Supply 8V ~ 36V
Base Part Number Kei Jpoel
Output Voltage 75 V
Output Type N-Channel
Interface I2C, SPI
Termination Type SOLDER
Operating Supply Current 1 mA
Nominal Supply Current 800 μA
Output Current 30 mA
Max Supply Current 80 μA
Slew Rate -
Architecture -
Amplifier Type OPERATIONAL AMPLIFIER
In-Stock:2675 items

About TOLCUT12032LQLCK

The TOLCUT12032LQLCK from SAMTECINC is a high-performance microcontroller designed for a wide range of embedded applications. This component features TOLCUT12032LQLCK datasheet pdf and Evaluation, Development Board Enclosures product details from SAMTECINC stock available on our website.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the TOLCUT12032LQLCK, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

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