Welcome to Hotenda.com Online Store!

logo
userjoin
Home

CL10B562KB8NNNL

CL10B562KB8NNNL

CL10B562KB8NNNL

Samsung Semiconductor

CL10B562KB8NNNL datasheet pdf and Unclassified product details from Samsung Semiconductor stock available on our website

SOT-23

CL10B562KB8NNNL Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Mount Surface Mount
Package / Case 0603
Terminal Shape WRAPAROUND
PackagingTape & Reel
Tolerance 10%
JESD-609 Code e3
Pbfree Code yes
Number of Terminations 2
ECCN Code EAR99
Temperature Coefficient15% ppm/°C
Terminal Finish Matte Tin (Sn) - with Nickel (Ni) barrier
Max Operating Temperature125°C
Min Operating Temperature -55°C
HTS Code8532.24.00.20
Capacitance 5.6nF
Voltage - Rated DC 50V
Packing Method TR, CARDBOARD PAPER, 13 INCH
Depth 800μm
Capacitor Type CERAMIC CAPACITOR
Dielectric X7R
Temperature Characteristics Code X7R
Multilayer Yes
Height 800μm
Length 1.6mm
Width 787.4μm
Thickness 889μm
Radiation HardeningNo
RoHS StatusRoHS Compliant
In-Stock:3390 items

About CL10B562KB8NNNL

The CL10B562KB8NNNL from Samsung Semiconductor is a high-performance microcontroller designed for a wide range of embedded applications. This component features CL10B562KB8NNNL datasheet pdf and Unclassified product details from Samsung Semiconductor stock available on our website.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the CL10B562KB8NNNL, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News