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NP160N04TUJ-E2-AY

NP160N04TUJ-E2-AY

NP160N04TUJ-E2-AY

Renesas Electronics America

TRANSISTOR

SOT-23

NP160N04TUJ-E2-AY Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Surface MountYES
Transistor Element Material SILICON
PackagingTape & Reel (TR)
Published 2010
Part StatusObsolete
Moisture Sensitivity Level (MSL) Vendor Undefined
Number of Terminations 6
ECCN Code EAR99
HTS Code8541.29.00.95
Subcategory FET General Purpose Power
Terminal Position SINGLE
Terminal FormGULL WING
Peak Reflow Temperature (Cel) NOT SPECIFIED
[email protected] Reflow Temperature-Max (s) NOT SPECIFIED
Pin Count7
JESD-30 Code R-PSSO-G6
Qualification StatusNot Qualified
Operating Temperature (Max) 175°C
Number of Elements 1
Configuration SINGLE WITH BUILT-IN DIODE
Operating ModeENHANCEMENT MODE
Case Connection DRAIN
Transistor Application SWITCHING
Polarity/Channel Type N-CHANNEL
Drain Current-Max (Abs) (ID) 160A
Drain-source On Resistance-Max 0.002Ohm
Pulsed Drain Current-Max (IDM) 640A
DS Breakdown Voltage-Min 40V
FET Technology METAL-OXIDE SEMICONDUCTOR
Power Dissipation-Max (Abs) 250W
RoHS StatusROHS3 Compliant
In-Stock:3544 items

About NP160N04TUJ-E2-AY

The NP160N04TUJ-E2-AY from Renesas Electronics America is a high-performance microcontroller designed for a wide range of embedded applications. This component features TRANSISTOR.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the NP160N04TUJ-E2-AY, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

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