Welcome to Hotenda.com Online Store!

logo
userjoin
Home

LN152

LN152

LN152

Panasonic Electronic Components

EMITTER IR 950NM 100MA TO-18

SOT-23

LN152 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Mount Through Hole
Mounting Type Through Hole
Package / Case TO-18 small
Shape ROUND
Operating Temperature-25°C~85°C TA
Published 2009
JESD-609 Code e0
Part StatusObsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type Infrared (IR)
Terminal Finish Tin/Lead (Sn/Pb)
HTS Code8541.40.20.00
Power Rating 10mW
Orientation Top View
Number of Functions 1
Reach Compliance Code unknown
Configuration SINGLE
Voltage - Forward (Vf) (Typ) 1.3V
Viewing Angle180°
Output Power10mW
Size 4.2mm
Rise Time1μs
Forward Current-Max 0.1A
Wavelength 950nm
Current - DC Forward (If) (Max) 100mA
Radiant Intensity (Ie) Min @ If 5mW/sr @ 100mA
RoHS StatusRoHS Compliant
Lead Free Lead Free
In-Stock:3330 items

Pricing & Ordering

QuantityUnit PriceExt. Price
1$198.487440$198.48744
10$187.252302$1872.52302
100$176.653115$17665.3115
500$166.653882$83326.941
1000$157.220643$157220.643

About LN152

The LN152 from Panasonic Electronic Components is a high-performance microcontroller designed for a wide range of embedded applications. This component features EMITTER IR 950NM 100MA TO-18.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the LN152, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News