Welcome to Hotenda.com Online Store!

logo
userjoin
Home

2SD1991ARA

2SD1991ARA

2SD1991ARA

Panasonic Electronic Components

TRANS NPN 50V 0.1A MT-1

SOT-23

2SD1991ARA Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Mount Through Hole
Mounting Type Through Hole
Package / Case 3-SIP
Number of Pins 3
Supplier Device Package MT-1-A1
Operating Temperature150°C TJ
PackagingTape & Box (TB)
Published 2003
Part StatusObsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Voltage - Rated DC 50V
Max Power Dissipation400mW
Current Rating100mA
Base Part Number 2SD1991
Power - Max 400mW
Transistor Type NPN
Collector Emitter Voltage (VCEO) 300mV
Max Collector Current 100mA
DC Current Gain (hFE) (Min) @ Ic, Vce 210 @ 2mA 10V
Current - Collector Cutoff (Max) 1μA
Vce Saturation (Max) @ Ib, Ic 300mV @ 10mA, 100mA
Collector Emitter Breakdown Voltage50V
Voltage - Collector Emitter Breakdown (Max) 50V
Current - Collector (Ic) (Max) 100mA
Max Breakdown Voltage 50V
Frequency - Transition 150MHz
RoHS StatusRoHS Compliant
Lead Free Contains Lead
In-Stock:1571 items

About 2SD1991ARA

The 2SD1991ARA from Panasonic Electronic Components is a high-performance microcontroller designed for a wide range of embedded applications. This component features TRANS NPN 50V 0.1A MT-1.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the 2SD1991ARA, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News