MC100LVEP34DG Overview
As a clock IC, it uses the Tube package. 16-SOIC (0.154, 3.90mm Width) contains this Clock PLL. In the reflowing process, this clock generator ic is able to maintain a maximum temperature of 260. 16 terminations can be found in frequency generators. This electronic frequency generator requires a voltage of 2.5V. It is designed that the Clock PLL's input should be CML, LVDS, NECL, PECL. A total of 1 circuits are implemented to access the full performance of the electrical part. Due to the Surface Mount-shape, this electronic component can be conveniently installed on the panel. There are 2.375V~3.8V different supply voltages that can be provided for this RF synthesizer. The ambient temperature should be set at -40°C~85°C, which is estimated by the test statistics. ECL logic levels are supported by this RF synthesizer. As far as this electronic part is concerned, it can be classified as a Clock Generator component. In this IC, a 16-bit frequency generator is designed specifically for use in microprocessors. It is possible to find its related electronic parts by searching for the base part number MC100LVEP34. There is a 16 pin that is available on the digital clock generator. In terms of the supply voltage, PLL clock can handle 3.3V volts. This electronic part is a member of the 100LVEP series. 3 signal outputs are provided for enhancing output frequency as much as possible. High efficiency is achieved when operating at a frequency of 2.8GHz. For the time clock generator to operate properly, 52mA of supply current are required. PLL is able to deliver the logic function of Clock.
MC100LVEP34DG Features
Available in the 16-SOIC (0.154, 3.90mm Width)
Supply voltage of 2.5V
Operating supply voltage of 3.3V
MC100LVEP34DG Applications
There are a lot of ON Semiconductor MC100LVEP34DG Clock Generators applications.
- Quenching?
- VSAT (Small Ground Satellite Station)
- Microprocessor clock multipliers
- Wireless base station for LTE, LTE-advanced
- Automatic control
- Mixed mode (analog and digital) applications
- Peripheral devices
- Automatic control system test
- Smartphones
- Instrument
