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2SK4066-DL-1E

2SK4066-DL-1E

2SK4066-DL-1E

ON Semiconductor

N-Channel Power MOSFET, 60V, 100A, 4.7mOhm, TO-262-3L/TO-263-2L

SOT-23

2SK4066-DL-1E Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Factory Lead Time 4 Weeks
Mounting Type Surface Mount
Package / Case TO-263-3, D2Pak (2 Leads + Tab), TO-263AB
Surface MountYES
Number of Pins 3
Operating Temperature150°C TJ
PackagingTape & Reel (TR)
Published 1997
JESD-609 Code e3
Pbfree Code yes
Part StatusObsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
ECCN Code EAR99
Terminal Finish Tin (Sn)
Subcategory FET General Purpose Powers
Technology MOSFET (Metal Oxide)
Pin Count2
Power Dissipation-Max 1.65W Ta 90W Tc
Element ConfigurationSingle
FET Type N-Channel
Rds On (Max) @ Id, Vgs 4.7m Ω @ 50A, 10V
Input Capacitance (Ciss) (Max) @ Vds 12500pF @ 20V
Current - Continuous Drain (Id) @ 25°C 100A Ta
Gate Charge (Qg) (Max) @ Vgs 220nC @ 10V
Drive Voltage (Max Rds On,Min Rds On) 4V 10V
Vgs (Max) ±20V
Continuous Drain Current (ID) 100A
Drain to Source Breakdown Voltage 60V
RoHS StatusRoHS Compliant
Lead Free Lead Free
In-Stock:4214 items

About 2SK4066-DL-1E

The 2SK4066-DL-1E from ON Semiconductor is a high-performance microcontroller designed for a wide range of embedded applications. This component features N-Channel Power MOSFET, 60V, 100A, 4.7mOhm, TO-262-3L/TO-263-2L.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the 2SK4066-DL-1E, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

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