Welcome to Hotenda.com Online Store!

logo
userjoin
Home

PCF51AC128ACLKE

PCF51AC128ACLKE

PCF51AC128ACLKE

NXP USA Inc.

128KB 128K x 8 FLASH Coldfire V1 32-Bit Microcontroller MCF51AC Series PCF51AC128 80-LQFP

SOT-23

PCF51AC128ACLKE Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Mounting Type Surface Mount
Package / Case 80-LQFP
Supplier Device Package 80-LQFP (14x14)
Operating Temperature-40°C~85°C TA
PackagingTray
Series MCF51AC
Published 2007
Part StatusObsolete
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Base Part Number PCF51AC128
Oscillator TypeExternal
Number of I/O 69
Speed 50MHz
RAM Size 32K x 8
Voltage - Supply (Vcc/Vdd) 2.7V~5.5V
Core Processor Coldfire V1
Peripherals LVD, PWM, WDT
Program Memory TypeFLASH
Core Size 32-Bit
Program Memory Size 128KB 128K x 8
Connectivity CANbus, I2C, SCI, SPI
Data Converter A/D 24x12b
RoHS StatusROHS3 Compliant
In-Stock:3030 items

PCF51AC128ACLKE Product Details

PCF51AC128ACLKE Overview


The package has a 80-LQFP shape. With 69 I/Os, it's pretty good. The Microcontroller's mounting type is Surface Mount and this IC chip has the following features. As the name implies, this Microcontroller is based on the 32-Bit core. As far as its program memory type is concerned, it is FLASH. Temperatures within -40°C~85°C TA range are measured by this Microcontroller. The MCF51AC series is comprised of this electrical component. The electronic part has a program memory size of 128KB 128K x 8. There's a Coldfire V1 Core Processor inside. It is possible to find alternatives to the base part number PCF51AC128 by using the part number search tool.

PCF51AC128ACLKE Features


80-LQFP package
Mounting type of Surface Mount


PCF51AC128ACLKE Applications


There are a lot of NXP USA Inc.
PCF51AC128ACLKE Microcontroller applications.


  • Robots
  • Radio
  • Television
  • Heater/Fan
  • Calculator
  • Kindle
  • Christmas lights
  • 3D printers
  • Washing machine
  • Microwave ovens

Get Subscriber

Enter Your Email Address, Get the Latest News