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BLM31AF700SN1L

BLM31AF700SN1L

BLM31AF700SN1L

Murata Electronics

BLM31AF700SN1L datasheet pdf and Ferrite Beads and Chips product details from Murata Electronics stock available on our website

SOT-23

BLM31AF700SN1L Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Contact PlatingTin
Mount Surface Mount
Number of Pins 2
Material Ferrite, Steel
Material - Core Ferrite
PackagingCut Tape
Tolerance 25%
JESD-609 Code e3
Pbfree Code yes
Termination SMD/SMT
ECCN Code EAR99
Resistance 500mOhm
Terminal Finish TIN
Max Operating Temperature125°C
Min Operating Temperature -55°C
HTS Code8504.50.80.00
Packing Method TAPE AND REEL
Shielding Unshielded
Number of Functions 1
Depth 1.8mm
Current Rating200mA
Military Standard Not
Case Code (Metric) 3216
Case Code (Imperial) 1206
Test Frequency100MHz
Impedance70Ohm
Max DC Current 200mA
DC Resistance (DCR) - Parallel 150mOhm
DC Current 200mA
Height 1.1mm
Length 3.2mm
Width 1.6mm
REACH SVHC No SVHC
Radiation HardeningNo
RoHS StatusRoHS Compliant
Lead Free Lead Free
In-Stock:1761 items

About BLM31AF700SN1L

The BLM31AF700SN1L from Murata Electronics is a high-performance microcontroller designed for a wide range of embedded applications. This component features BLM31AF700SN1L datasheet pdf and Ferrite Beads and Chips product details from Murata Electronics stock available on our website.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the BLM31AF700SN1L, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

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