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CDLL4678

CDLL4678

CDLL4678

Microsemi Corporation

ZENER DIODE ±5% 1.8V 7.5μA @ 1V -65°C~175°C 500mW 2 Terminations DO-213AA

SOT-23

CDLL4678 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Lifecycle Status IN PRODUCTION (Last Updated: 1 month ago)
Factory Lead Time 15 Weeks
Mount Surface Mount
Mounting Type Surface Mount
Package / Case DO-213AA
Diode Element Material SILICON
Operating Temperature-65°C~175°C
PackagingBulk
Published 1999
Tolerance ±5%
JESD-609 Code e0
Pbfree Code no
Part StatusActive
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Number of Terminations 2
ECCN Code EAR99
Terminal Finish TIN LEAD
Additional FeatureMETALLURGICALLY BONDED
HTS Code8541.10.00.50
Max Power Dissipation500mW
Terminal Position END
Terminal FormWRAP AROUND
Pin Count2
JESD-30 Code O-LELF-R2
Number of Elements 1
Polarity UNIDIRECTIONAL
Element ConfigurationSingle
Diode Type ZENER DIODE
Current - Reverse Leakage @ Vr 7.5μA @ 1V
Voltage - Forward (Vf) (Max) @ If 1.1V @ 200mA
Case Connection ISOLATED
Max Reverse Leakage Current 7.5μA
Reference Voltage1.8V
Zener Voltage 1.8V
Voltage Tol-Max 5%
Working Test Current 0.05mA
Radiation HardeningNo
RoHS StatusNon-RoHS Compliant
In-Stock:2570 items

Pricing & Ordering

QuantityUnit PriceExt. Price
286$3.23752$925.93072

CDLL4678 Product Details

CDLL4678 Overview


An electrical device such as this requires reverse leakage current of 7.5μA @ 1V.A voltage of 5% is considered to be the maximum that can be output (Tol).A maximum reverse leakage current is reached at 7.5μA.Setting the working test voltage to 0.05mA is required to operate this device.As soon as the maximum voltage - Forward (Vf) is supplied, it reaches 1.1V @ 200mA V.

CDLL4678 Features


reverse leakage current of 7.5μA @ 1V
7.5μA @ 1V is the maximum voltage (Tol)
Reverse leakage current reaches 7.5μA
the working test voltage to 0.05mA
minimal dynamic impedance is 0.05mA


CDLL4678 Applications


There are a lot of Microsemi Corporation
CDLL4678 applications of zener single diodes.


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