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1N6129

1N6129

1N6129

Microsemi Corporation

Diode TVS Single Bi-Dir 69.2V 500W 2-Pin Case E

SOT-23

1N6129 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Factory Lead Time 8 Weeks
Lifecycle Status IN PRODUCTION (Last Updated: 1 month ago)
Mount Through Hole
Number of Pins 2
Diode Element Material SILICON
PackagingBulk
Published 1997
JESD-609 Code e0
Pbfree Code no
Part StatusActive
Number of Terminations 2
ECCN Code EAR99
Terminal Finish TIN LEAD
Max Operating Temperature175°C
Min Operating Temperature -55°C
Additional FeatureHIGH RELIABILITY
HTS Code8541.10.00.50
Technology AVALANCHE
Terminal Position AXIAL
Terminal FormWIRE
Pin Count2
Number of Elements 1
Power Dissipation-Max 2W
Element ConfigurationSingle
Diode Type TRANS VOLTAGE SUPPRESSOR DIODE
Case Connection ISOLATED
Max Reverse Leakage Current 1μA
Clamping Voltage 125.1V
Peak Pulse Current4A
Reverse Standoff Voltage 69.2V
Peak Pulse Power 500W
Direction Bidirectional
Test Current 15mA
Min Breakdown Voltage 86.5V
Radiation HardeningNo
RoHS StatusNon-RoHS Compliant
In-Stock:691 items

Pricing & Ordering

QuantityUnit PriceExt. Price
250$11.58780$2896.95

About 1N6129

The 1N6129 from Microsemi Corporation is a high-performance microcontroller designed for a wide range of embedded applications. This component features Diode TVS Single Bi-Dir 69.2V 500W 2-Pin Case E.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the 1N6129, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

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