Welcome to Hotenda.com Online Store!

logo
userjoin
Home

1N4454

1N4454

1N4454

Microsemi Corporation

DIODE GEN PURP 75V 200MA DO35

SOT-23

1N4454 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Factory Lead Time 17 Weeks
Lifecycle Status IN PRODUCTION (Last Updated: 1 month ago)
Mount Through Hole
Mounting Type Through Hole
Package / Case DO-204AH, DO-35, Axial
Number of Pins 2
Supplier Device Package DO-35
PackagingBulk
Published 1997
Part StatusActive
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Max Operating Temperature175°C
Min Operating Temperature -65°C
Voltage 50V
Element ConfigurationSingle
Speed Small Signal =< 200mA (Io), Any Speed
Current 4A
Diode Type Standard
Current - Reverse Leakage @ Vr 100nA @ 50V
Voltage - Forward (Vf) (Max) @ If 1V @ 10mA
Forward Current300mA
Operating Temperature - Junction -65°C~175°C
Voltage - DC Reverse (Vr) (Max) 75V
Current - Average Rectified (Io) 200mA
Max Reverse Voltage (DC) 75V
Average Rectified Current200mA
Reverse Recovery Time 4 ns
Peak Non-Repetitive Surge Current 1A
Radiation HardeningNo
RoHS StatusNon-RoHS Compliant
In-Stock:367034 items

Pricing & Ordering

QuantityUnit PriceExt. Price

About 1N4454

The 1N4454 from Microsemi Corporation is a high-performance microcontroller designed for a wide range of embedded applications. This component features DIODE GEN PURP 75V 200MA DO35.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the 1N4454, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News