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1812J0500684MXTE03

1812J0500684MXTE03

1812J0500684MXTE03

Knowles Syfer

Feed Through Capacitors 1812 0.68uF 50v X7R 20% X2Y Filter

SOT-23

1812J0500684MXTE03 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Factory Lead Time 8 Weeks
Mount Through Hole
Mounting Type Surface Mount, MLCC
Package / Case 1812 (4532 Metric)
Number of Pins 1812
Operating Temperature-55°C~125°C
PackagingTape & Reel (TR)
Size / Dimension 0.177Lx0.126W 4.50mmx3.20mm
Tolerance ±20%
JESD-609 Code e3
Feature Low ESL (X2Y)
Part StatusActive
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Termination SMD/SMT
Temperature CoefficientX7R 2R1
Terminal Finish Matte Tin (Sn) - with Nickel (Ni) barrier
Applications Bypass, Decoupling
Additional FeatureNICKEL BARRIER TERMINATION
Capacitance 0.68μF
Voltage - Rated DC 50V
Number of Functions 2
Physical Dimension L4.5XB3.2XH2.0 (mm)/L0.177XB0.126XH0.079 (inch)
Circuit TypeFilter
Filter Type FEED THROUGH CAPACITOR
Insulation Resistance-Min 10000MOhm
Height 2mm
Length 4.5mm
Thickness (Max) 0.030 0.75mm
RoHS StatusROHS3 Compliant
In-Stock:2117 items

Pricing & Ordering

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About 1812J0500684MXTE03

The 1812J0500684MXTE03 from Knowles Syfer is a high-performance microcontroller designed for a wide range of embedded applications. This component features Feed Through Capacitors 1812 0.68uF 50v X7R 20% X2Y Filter.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the 1812J0500684MXTE03, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

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