Welcome to Hotenda.com Online Store!

logo
userjoin
Home

XMLBEZ-00-0000-0B0UT627F

XMLBEZ-00-0000-0B0UT627F

XMLBEZ-00-0000-0B0UT627F

Cree Inc.

LED EASYWHT WARM WHT 2700K 2SMD

SOT-23

XMLBEZ-00-0000-0B0UT627F Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Factory Lead Time 14 Weeks
Mount Surface Mount
Mounting Type Surface Mount
Package / Case 2020 (5050 Metric)
Thermal Resistance of Package 2.5°C/W
PackagingTape & Reel (TR)
Series Easywhite®, Xlamp® XM-L2
Size / Dimension 0.197Lx0.197W 5.00mmx5.00mm
Part StatusActive
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Color White, Warm
HTS Code8541.40.20.00
Max Current Rating 2A
Voltage - Forward (Vf) (Typ) 6V
Viewing Angle115°
Optoelectronic Device Type SINGLE COLOR LED
Current - Test 700mA
Lumens/Watt @ Current - Test 69 lm/W
CCT (K) 2700K 4-Step MacAdam Ellipse
CRI (Color Rendering Index) 90
Flux @ 85°C, Current - Test 290lm 280lm~300lm
Height Seated (Max) 0.124 3.15mm
RoHS StatusRoHS Compliant
In-Stock:2156 items

Pricing & Ordering

QuantityUnit PriceExt. Price

About XMLBEZ-00-0000-0B0UT627F

The XMLBEZ-00-0000-0B0UT627F from Cree Inc. is a high-performance microcontroller designed for a wide range of embedded applications. This component features LED EASYWHT WARM WHT 2700K 2SMD.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the XMLBEZ-00-0000-0B0UT627F, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News