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SN330M063ST

SN330M063ST

SN330M063ST

Cornell Dubilier Electronics (CDE)

CAP ALUM 33UF 20% 63V RADIAL

SOT-23

SN330M063ST Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Mount Through Hole
Mounting Type Through Hole
Package / Case Radial, Can
Terminal Shape WIRE
Number of Pins 2
Dielectric MaterialAluminium
Operating Temperature-40°C~85°C
PackagingBulk
Published 2013
Series SN
Size / Dimension 0.394Dia 10.00mm
Tolerance ±20%
JESD-609 Code e3
Pbfree Code yes
Part StatusObsolete
Moisture Sensitivity Level (MSL) Not Applicable
Number of Terminations 2
Termination Radial
ECCN Code EAR99
Applications General Purpose
Capacitance 33μF
Voltage - Rated DC 63V
Terminal Pitch5mm
Lead Pitch 5.0038mm
Capacitor Type ALUMINUM ELECTROLYTIC CAPACITOR
ESR (Equivalent Series Resistance) 4.83Ohm @ 120Hz
Polarity NON-POLARIZED
Lead Spacing0.197 5.00mm
Lifetime @ Temp 1000 Hrs @ 85°C
Leakage Current 0.06637mA
Ripple Current175mA
Polarization Bi-Polar
Life (Hours) 1000 hours
Ripple Current @ Low Frequency 175mA @ 120Hz
Diameter 10mm
Height 20mm
Height Seated (Max) 0.787 20.00mm
RoHS StatusROHS3 Compliant
In-Stock:2060 items

About SN330M063ST

The SN330M063ST from Cornell Dubilier Electronics (CDE) is a high-performance microcontroller designed for a wide range of embedded applications. This component features CAP ALUM 33UF 20% 63V RADIAL.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the SN330M063ST, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

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