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UTS1H220MDD

UTS1H220MDD

UTS1H220MDD

Nichicon

CAP ALUM 22UF 20% 50V RADIAL

SOT-23

UTS1H220MDD Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Mount Through Hole
Mounting Type Through Hole
Package / Case Radial, Can
Terminal Shape WIRE
Dielectric MaterialALUMINUM (WET)
Operating Temperature-40°C~105°C
PackagingBulk
Published 2009
Series UTS
Size / Dimension 0.248Dia 6.30mm
Tolerance ±20%
JESD-609 Code e3
Feature General Purpose
Pbfree Code yes
Part StatusObsolete
Moisture Sensitivity Level (MSL) Not Applicable
Number of Terminations 2
Termination Radial
ECCN Code EAR99
Terminal Finish Matte Tin (Sn)
Applications General Purpose
HTS Code8532.22.00
Capacitance 22μF
Voltage - Rated DC 50V
Terminal Pitch2.5mm
Lead Pitch 2.4892mm
Capacitor Type ALUMINUM ELECTROLYTIC CAPACITOR
Lead Spacing0.098 2.50mm
Lifetime @ Temp 5000 Hrs @ 105°C
Leakage Current 0.033mA
Ripple Current86mA
Polarization Polar
Life (Hours) 5000 hours
Ripple Current @ Low Frequency 43mA @ 120Hz
Ripple Current @ High Frequency 86mA @ 100kHz
Dissipation Factor0.14 %
Diameter 6.3mm
Height 9mm
Height Seated (Max) 0.354 9.00mm
RoHS StatusRoHS Compliant
In-Stock:1161 items

About UTS1H220MDD

The UTS1H220MDD from Nichicon is a high-performance microcontroller designed for a wide range of embedded applications. This component features CAP ALUM 22UF 20% 50V RADIAL.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the UTS1H220MDD, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

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