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PSMN8R5-100ES

PSMN8R5-100ES

PSMN8R5-100ES

NXP SEMICONDUCTORS

PSMN8R5-100ES datasheet pdf and Unclassified product details from NXP SEMICONDUCTORS stock available on our website

SOT-23

PSMN8R5-100ES Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Surface MountNO
Number of Terminals 3
Transistor Element Material SILICON
JESD-609 Code e3
ECCN Code EAR99
Terminal Finish TIN
Terminal Position SINGLE
Terminal FormTHROUGH-HOLE
Peak Reflow Temperature (Cel) NOT SPECIFIED
Time@Peak Reflow Temperature-Max (s) NOT SPECIFIED
Reference Standard IEC-60134
JESD-30 Code R-PSIP-T3
Number of Elements 1
Configuration SINGLE WITH BUILT-IN DIODE
Operating ModeENHANCEMENT MODE
Case Connection DRAIN
Transistor Application SWITCHING
Polarity/Channel Type N-CHANNEL
JEDEC-95 Code TO-262AA
Drain Current-Max (Abs) (ID) 100A
Drain-source On Resistance-Max 0.0085Ohm
Pulsed Drain Current-Max (IDM) 429A
DS Breakdown Voltage-Min 100V
Avalanche Energy Rating (Eas) 219 mJ
FET Technology METAL-OXIDE SEMICONDUCTOR
RoHS StatusRoHS Compliant
In-Stock:4327 items

About PSMN8R5-100ES

The PSMN8R5-100ES from NXP SEMICONDUCTORS is a high-performance microcontroller designed for a wide range of embedded applications. This component features PSMN8R5-100ES datasheet pdf and Unclassified product details from NXP SEMICONDUCTORS stock available on our website.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the PSMN8R5-100ES, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

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