Welcome to Hotenda.com Online Store!

logo
userjoin
Home

C702 10M008 1214

C702 10M008 1214

C702 10M008 1214

Amphenol Sine Systems Corp

CONN SMART CARD PUSH-PULL R/A

SOT-23

C702 10M008 1214 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Factory Lead Time 12 Weeks
Contact MaterialNOT SPECIFIED
Mounting Type Through Hole, Right Angle
Mounting FeatureNormal, Standard - Top
PackagingTray
Published 2004
Series C702F
Feature Board Guide, Switch
Part StatusActive
Moisture Sensitivity Level (MSL) Not Applicable
Connector Type Connector
Number of Positions 10 (8 + 2)
Contact Finish - Mating NOT SPECIFIED
MIL Conformance NO
DIN Conformance NO
IEC Conformance NO
Option GENERAL PURPOSE
Reach Compliance Code unknown
Card Type Smart Card
Insertion, Removal Method Push In, Pull Out
Height Above Board 0.252 6.40mm
RoHS StatusROHS3 Compliant
In-Stock:1722 items

Pricing & Ordering

QuantityUnit PriceExt. Price
1$12.87000$12.87
10$11.70000$117
25$11.40760$285.19
50$10.53000$526.5
100$9.94500$994.5
250$9.06752$2266.88
500$8.48250$4241.25

About C702 10M008 1214

The C702 10M008 1214 from Amphenol Sine Systems Corp is a high-performance microcontroller designed for a wide range of embedded applications. This component features CONN SMART CARD PUSH-PULL R/A.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the C702 10M008 1214, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News