3M’s IC test clips are useful in prototype and production testing, quality control inspection, and field service and are an indispensable tool for the electronics industry. They make in-circuit IC testing safer by providing easy access to IC leads for probes without danger of shorting out valuable chips. Test clips are available in both nail head and “headless” leads to accommodate a wide range of applications. The IC test clips feature heavy duty helical compression springs to provide firm and positive contact pressure and feature an insulating contact comb to help prevent accidental shorts. 3M IC test clips feature steel hinge pins and tough, glass filled polyester bodies, UL rated 94V-0, to provide long service life.